Power aging is a very effective screening method, which is one of the necessary screening methods for highly reliable power adapter products. Power aging helps eliminate potential defects in early failure devices by applying excessive electrical stress to the power adapter. It can effectively eliminate the process defects in the process of device production.

 

Power aging is usually to put the switch power adapter under high temperature conditions, apply the maximum voltage, load, in order to get enough screening stress, to achieve the purpose of eliminating early failure products. The applied electrical stress includes the input ac high voltage, power aging, voltage shock. The components inside the switching power adapter can withstand the maximum power consumption and stress during the aging process. Overpower aging obviously shortens the aging time, but it is also possible to make the instantaneous load of the device exceed the maximum rating, so that qualified devices suffer damage, or even immediate deterioration or breakdown. Some products may still work for a while, but their life is shortened. Therefore, for ultra-power aging, it is not the more the more effective, but should choose an optimal overload.
Now the more consistent method is to apply the maximum rated power to the power adapter and extend the aging time appropriately.
Reliability screening tests are designed to determine the test conditions, including the test item, test stress and test time. Due to the different types of products, the failure mechanism of the products produced by different manufacturers or using different materials, structures and technological processes is different, and the cut-off point between the early failure period and the accidental failure period is not the same, it is difficult to formulate a unified reliability screening test condition suitable for various products. Therefore, it is necessary to conduct a large number of reliability test or reliability screening test according to the characteristics of the product, master the relationship between the failure distribution and failure mechanism of the product and the screening test items, stress and time, and then correctly formulate the reliability screening test conditions of the product. Obviously, if the reliability screening test conditions are not appropriate, some products may fail to meet the requirements for reliability and stability due to insufficient screening test strength, or fail to screen out these early failure products due to missing the necessary screening test items. IN addition, the screening test conditions may be too strict to eliminate a part of the good product.

Power aging is a very effective screening method, which is one of the necessary screening methods for highly reliable power adapter products. Power aging helps eliminate potential defects in early failure devices by applying excessive electrical stress to the power adapter. It can effectively eliminate the process defects in the process of device production.
 
Power aging is usually to put the switch power adapter under high temperature conditions, apply the maximum voltage, load, in order to get enough screening stress, to achieve the purpose of eliminating early failure products. The applied electrical stress includes the input ac high voltage, power aging, voltage shock. The components inside the switching power adapter can withstand the maximum power consumption and stress during the aging process. Overpower aging obviously shortens the aging time, but it is also possible to make the instantaneous load of the device exceed the maximum rating, so that qualified devices suffer damage, or even immediate deterioration or breakdown. Some products may still work for a while, but their life is shortened. Therefore, for ultra-power aging, it is not the more the more effective, but should choose an optimal overload.
Now the more consistent method is to apply the maximum rated power to the power adapter and extend the aging time appropriately.
Reliability screening tests are designed to determine the test conditions, including the test item, test stress and test time. Due to the different types of products, the failure mechanism of the products produced by different manufacturers or using different materials, structures and technological processes is different, and the cut-off point between the early failure period and the accidental failure period is not the same, it is difficult to formulate a unified reliability screening test condition suitable for various products. Therefore, it is necessary to conduct a large number of reliability test or reliability screening test according to the characteristics of the product, master the relationship between the failure distribution and failure mechanism of the product and the screening test items, stress and time, and then correctly formulate the reliability screening test conditions of the product. Obviously, if the reliability screening test conditions are not appropriate, some products may fail to meet the requirements for reliability and stability due to insufficient screening test strength, or fail to screen out these early failure products due to missing the necessary screening test items. IN addition, the screening test conditions may be too strict to eliminate a part of the good product.
 
Power aging is a very effective screening method, which is one of the necessary screening methods for highly reliable power adapter products. Power aging helps eliminate potential defects in early failure devices by applying excessive electrical stress to the power adapter. It can effectively eliminate the process defects in the process of device production.
 
Power aging is usually to put the switch power adapter under high temperature conditions, apply the maximum voltage, load, in order to get enough screening stress, to achieve the purpose of eliminating early failure products. The applied electrical stress includes the input ac high voltage, power aging, voltage shock. The components inside the switching power adapter can withstand the maximum power consumption and stress during the aging process. Overpower aging obviously shortens the aging time, but it is also possible to make the instantaneous load of the device exceed the maximum rating, so that qualified devices suffer damage, or even immediate deterioration or breakdown. Some products may still work for a while, but their life is shortened. Therefore, for ultra-power aging, it is not the more the more effective, but should choose an optimal overload.
Now the more consistent method is to apply the maximum rated power to the power adapter and extend the aging time appropriately.
Reliability screening tests are designed to determine the test conditions, including the test item, test stress and test time. Due to the different types of products, the failure mechanism of the products produced by different manufacturers or using different materials, structures and technological processes is different, and the cut-off point between the early failure period and the accidental failure period is not the same, it is difficult to formulate a unified reliability screening test condition suitable for various products. Therefore, it is necessary to conduct a large number of reliability test or reliability screening test according to the characteristics of the product, master the relationship between the failure distribution and failure mechanism of the product and the screening test items, stress and time, and then correctly formulate the reliability screening test conditions of the product. Obviously, if the reliability screening test conditions are not appropriate, some products may fail to meet the requirements for reliability and stability due to insufficient screening test strength, or fail to screen out these early failure products due to missing the necessary screening test items. IN addition, the screening test conditions may be too strict to eliminate a part of the good product.
 

                                                                                                                                                                           Anna

                                                                                                                                                                  2019-4-28

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